| 4 |
JungHun Kim, Hai Au Huynh, and SoYoung Kim |
Modeling of FinFET Parasitic Source/Drain Resistance With Polygonal Epitaxy |
IEEE Transactions on Electron Devices |
Vol. 64, No. 5, pp.2072-2079, |
201705 |
SCI |
ICDS |
| 3 |
Hai Au Huynh, Jeong-Min Jo, Wansoo Nah, SoYoung Kim |
EMC Qualification Methodology for Semicustom Digital Integrated Circuit Design |
IEEE Transactions on Electromagnetic Compatibility |
pp. 1-13, vol. 53, no. 10 |
201610 |
SCI |
ICDS |
| 2 |
Ikchan Jang, Yoonmyung Lee, SoYoung Kim, Jintae Kim |
Power-Performance Tradeoff Analysis of CML-based High-Speed Transmitter Designs using Circuit-Level Optimization |
IEEE Transactions on Circuit and Systems - I |
pp. 540-550, vol. 63, no. 4 |
201604 |
SCI |
ICDS |
| 1 |
JinHyuk Jeong, Ho Lee, DongHae Kang, and SoYoung Kim |
Gate Engineering to Improve Effective Resistance of 28-nm High-k Metal Gate CMOS Devices |
IEEE Transactions on Electron Devices |
pp.259-264, vol.63, no.1 |
201601 |
SCI |
ICDS |
